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Nigel Meeks, Caroline Cartwright, Andrew Meek, Aude Mongiatti: Historical Technology, Materials and Conservation

Nigel Meeks, Caroline Cartwright, Andrew Meek, Aude Mongiatti: Historical Technology, Materials and Conservation

Nigel Meeks, Caroline Cartwright, Andrew Meek, Aude Mongiatti: Historical Technology, Materials and Conservation (1 St)

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Nigel Meeks, Caroline Cartwright, Andrew Meek, Aude Mongiatti: Historical Technology, Materials and Conservation.

Scanning Electron Microscopy (SEM) and Microanalysis in conservation.

2012, 224 pages.

Menge

ODER

Wunschliste

Produktdetails: Details

SEM and Microanalysis

In the decades since it was first used to examine works of art and archaeological pieces, scanning electron microscopy (SEM) has become an essential tool in any museum or gallery laboratory, allowing details of the surface and the way in which it has been modified – for example by manufacturing or during conservation – to be scrutinised. The possibility of applying microanalytical methods within the scanning electron microscope, most notably energy dispersive X-ray (EDX) analysis, has greatly increased the versatility of the technique, making it indispensable in the study of materials.

2012, 224 Seiten, zahlreiche, teils farbige Abbildungen. Broschur.